Patent application for focal distance measurement

A patent application P.412267 for the measurement of the position of the focal
plane and focal distance of an optical set-up (Pol. "Układ pomiarowy do
wyznaczania położenia płaszczyzny ogniskowej i długości ogniskowej układu
optycznego oraz sposób wyznaczania położenia płaszczyzny ogniskowej i długości ogniskowej układu optycznego") has been submitted to the Polish Patenting
Office on 08.05.2015. Subsequently on 05.05.2016 the PCT application was filed
in World Intellectual Property Office and registered under #PCT/IB2016/000583.
The application is authored by Wojciech  Wasilewski
and Radosław Chrapkiewicz.
Summary of the application: The invention includes a measurement set-up for the determination
of the position of the focal plane and for the measurement of the focal
distance of an optical set-up, which comprises, located at the optical
axis (4), a light source (1), a movable detector (5), and at least
two similar diffraction gratings (2,3) positioned in between
the light source (1) and the optical set-up (4).

The invention includes the method for the determination of the focal
plane location and for the measurement of the focal distance of an optical
set-up, in which the optical set-up (4), is being positioned in between
the diffraction gratings (2,3) and the detector (5). Following, at least
one of the diffraction gratings (2,3) is rotated along the axis
of the set-up to reach a non-zero angle in between the diffraction gratings
as well as the position of the detector (5) is varied along the optical axis,
until the focal plane is found, at which the spots at the detector (5) will
overlap.
 

08.05.2015 - 05.05.2016